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ICAO testing laboratory

e-passports physical characteristics testing

As identity protection becomes ever more important in our digital world, authorities face the challenge of ID verification.

ICAO testing laboratory

Air traveler volumes are set to rise from 5 billion today to 7 billion by 2030. This presents border authorities around the world another challenge of guaranteeing fast traveler flow in and out of their countries while ensuring the highest border security.

e-passports bring :

  • easier border checking, with automatic boarders controls, with highest border security,
  • higher security level, while important information is printed and write inside chip.

e-passports help to :

  • securely identify the traveler,
  • provide protection against identity theft, as it is difficult to alter or duplicate the document.

The electronic chip embedded in the e-passport contains biographic and biometric data . This data can be compared with printed information and the traveler.

By expansion of its expertise, ELITT is deeply involved in this travel document testing.

ELITT performs durability tests on e-passports, in accordance with ISO 18745 (previously ICAO Technical Report).

For that, ELITT owns several high-performance tests benches, designed in accordance with ISO 18745 requirements.

ISO 18745 compliant e-passports facilitate interoperability at border controls from multiple countries.

You will find more details on all ISO norms on the page dedicated to ELITT's ISO testing laboratory.

ICAO tests provided by ELITT

Climate tests
  • Thermal Cycling
  • Storage temperature
  • Operational temperature
Mecanical tests
  • Impact
  • Book Bend (Back Pocket)
  • Dynamic Bend
  • Torsion
Exposure tests
  • Resistance to chemicals
  • Artificial Daylight exposure
  • X-Ray(s)
ICAO Doc 9303 Compliance

List of supported tests

(ICAO Technical Report v3.2 / ISO/IEC 18745-1:2014 Information technology -- Test methods for machine readable travel documents (MRTD) and associated devices -- Part 1: Physical test methods for passport books (durability))

  • Conditioning Stress Method
  • Thermal Cycling Method
  • Storage Temperature Stress Method
  • Operational Temperature Stress Method
  • Impact Stress Method
  • Book Bend Stress Method (Back Pocket)
  • Dynamic Bend Stress Method
  • Torsion Stress Method
  • Sheet Turning Stress Method
  • Sheet Pull Stress Method
  • Abrasion Stress Method
  • Pen Stress Method
  • Resistance to chemicals Evaluation Method
  • Artificial Daylight Exposure Stress Method
  • X-Ray Stress Method
  • Functional PIC Evaluation Method
  • Physical Damage Evaluation Method
  • Peel Strength Evaluation Method
  • Colour Fastness Evaluation Method
  • Datapage Warpage Evaluation Method
  • Book Warpage Evaluation Method
  • Sheet Binding Sequence
  • Storage Climate Sequence
  • Operational Climate Sequence
  • Impact Sequence
  • Back Pocket Sequence
  • Torsion Fatigue Sequence
  • Delamination Sequence
  • Bending Fatigue Sequence
  • Thermal Cycling Sequence
  • Colour Fastness Sequence
  • Resistance to Chemicals Sequence
  • Pen Sequence
  • Datapage Abrasion Sequence
  • X-Ray Sequence
  • RF Protocol and Application test standard for ePassport part 2 Tests for air interface, initialisation, anticollision and transport protocol
  • RF Protocol and Application test standard for ePassport part 3 Tests for application protocol and logical data structure


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Contact us

Campus EffiScience
8 rue Léopold Sédar-Senghor
14460 Colombelles (France)
Tél : +33 (0)2 31 35 34 60

ELITT - Campus EffiScience 8 rue Léopold Sédar-Senghor - 14460 Colombelles (France)
Tél : +33 (0)2 31 35 34 60 -

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